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Mass spectrometric studies of the mechanism of film inhibition in hydrogen/methane plasmas in the presence of nitrogen

机译:氮存在下氢气/甲烷等离子体中薄膜抑制机理的质谱研究

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摘要

Complete suppression of amorphous C:H film deposition has been reported for N2/CH4 ratios ∼1, in low-pressure technical plasmas. This finding has been recently used by the authors for the proposal of a possible technique for the inhibition of re-deposited T-containing carbon films at the divertor region of fusion devices. Although several works aiming to the understanding of the underlying physicochemical processes have been published, the complexity of the system is far from being properly described by the proposed models. In the present work, experiments in DC glow discharges at low pressure of H2/CH4/N2 admixtures (90:0–5:0–5) are described. Mass spectrometry of neutral species as well as plasma mass spectrometry for ion detection have been used as the main diagnostics. Several plasma conditions (plasma current, gas composition, etc.) as well as isotopic exchange (H/D) have been investigated. Also, the effect of progressive film growing on the metal walls of the reactor in the composition of gas-phase species has been investigated. It is concluded that wall carbonisation is required to trigger the inhibition process. Ethylene and acetylene are found as the main reaction products. © 2004 Elsevier Ltd
机译:据报道,在低压工业等离子中,N2 / CH4比约为1时,完全抑制了非晶C:H膜沉积。该发现最近已被作者用于提出一种可能的技术的建议,该技术用于抑制在聚变装置的偏滤器区域上再沉积的含T的碳膜。尽管已经发表了一些旨在理解潜在物理化学过程的著作,但是该系统的复杂性还远不能被所提出的模型恰当地描述。在目前的工作中,描述了在H2 / CH4 / N2混合物(90:0-5:0-5)的低压下进行直流辉光放电的实验。中性物质的质谱分析以及用于离子检测的等离子体质谱法已被用作主要诊断方法。已经研究了几种等离子体条件(等离子体电流,气体成分等)以及同位素交换(H / D)。同样,已经研究了在气相物质的组成中反应器的金属壁上渐进膜生长的影响。结论是需要壁碳化来触发抑制过程。发现乙烯和乙炔是主要反应产物。 ©2004 Elsevier Ltd

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